SELECT A.NAME LOT, LPAD(B.SLOT, 2, '0') SLOT, C.D_SEQ Seq, C.DIE_R_IDX ROW, C.DIE_C_IDX Col,
C.XSIZE Size_X, C.YSIZE Size_y, C.DAREA Area, C.DSIZE Dsize, C.CLASS, E.CLASS, C.ID, C.IMAGE, F.DEVICE, C.CREATE_TIME, C.REVIEWER, C.VALIDATOR, D.CLASS, C.PSIZE, D.CLASS AS ADC_CLASS
FROM TB_WAFER_MAP F, TB_LOT A, TB_REVIEW B, TB_POINT C
LEFT OUTER JOIN TB_POINT_VERIFIED E
ON C.ID = E.POINT_ID
INNER JOIN (
SELECT T.MODEL_ID, T.POINT_ID, T.CLASS
FROM (
SELECT MODEL_ID, POINT_ID, CLASS, UPDATE_TIME
FROM TB_ADC_RESULT
UNION ALL
SELECT MODEL_ID, POINT_ID, CLASS, UPDATE_TIME
FROM TB_ADC_REF_RESULT
) T
WHERE T.UPDATE_TIME = (
SELECT MAX(UPDATE_TIME)
FROM (
SELECT MODEL_ID, POINT_ID, CLASS, UPDATE_TIME
FROM TB_ADC_RESULT
UNION ALL
SELECT MODEL_ID, POINT_ID, CLASS, UPDATE_TIME
FROM TB_ADC_REF_RESULT
) TT
WHERE T.MODEL_ID = TT.MODEL_ID AND T.POINT_ID = TT.POINT_ID
)
GROUP BY T.MODEL_ID, T.POINT_ID, T.CLASS
)D
ON D.POINT_ID = C.ID
WHERE A.ID = B.LOT_ID AND C.REVIEW_ID = B.ID AND D.MODEl_ID = 8 AND A.WAFER_MAP_ID = F.ID;